Our scientists have published numerous refereed journal articles and conference proceedings as well as presenting on multiple technical topics at local, national and international conferences. We also have provided training on instrumentation and techniques. A list of our publications is provided below.
For copies of our publications or to request more information about our educational materials, please email us at info@nanospective.com.
Brenda I. Prenitzer, Ph.D. - President & CEO
Dr. Prenitzer provides vision and leadership to the company as well as technical expertise
in the areas of materials and materials characterization. Her areas of specialization
include scanning electron and ion microscopies i.e., transmission electron microscopy
(TEM) and related microanalytical techniques including energy dispersive X-ray
spectroscopy (X-EDS) and electron energy loss spectroscopy (EELS), focused ion beam
microscopy (FIB) and scanning electron microscopy (SEM). Other areas of technical
expertise include optical and electronic materials. Dr. Prenitzer holds a B.S. in Chemistry
and a Ph.D. in Mechanical Engineering with the Materials Science option from the
University of Central Florida. She has both academic research as well as industry
experience. Dr. Prenitzer has co-authored over 45 refereed journal articles and
conference proceedings as well as numerous platform presentations at numerous local,
national and international conferences.
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Brian W. Kempshall, Ph.D. - Vice President & CTO
Dr. Kempshall provides technical direction to the company as well as technical expertise
in the areas of materials and materials characterization. His areas of specialization
include transmission electron microscopy (TEM) and related microanalytical techniques
including energy dispersive X-ray spectroscopy (X-EDS) and electron energy loss
spectroscopy (EELS), scanning electron microscopy (SEM) and secondary ion mass
spectroscopy (SIMS). Additionally, Dr. Kempshall has renowned expertise in the field of
focused ion beam (FIB) technology. Dr. Kempshall holds a B.S. in Mechanical
Engineering and a Ph.D. in Materials Science and Engineering from the University of
Central Florida. Dr. Kempshall has co-authored over 20 refereed journal articles and
conference proceedings as well as numerous platform presentations at local, national and
international conferences.
Stephen M. Schwarz, Ph.D. - Vice President & COO
Dr. Schwarz provides operational direction to the company as well as technical expertise
in the areas of materials and materials characterization. His areas of specialization
include focused ion beam microscopy (FIB), scanning electron microscopy (SEM) and
transmission electron microscopy (TEM). Dr. Schwarz holds a B.S. degree in Electrical
from the Milwaukee School of Engineering, a B.S. degree in Mechanical Engineering and
a Ph.D. in Materials Science and Engineering from the University of Central Florida. He
has both academic research as well as industry experience. Dr. Schwarz has coauthored
over 15 refereed journal articles and conference proceedings as well as
numerous platform presentations at local, national and international conferences.
Publications
Refereed Journal Articles
“Coatings and Joining for SiC and SiC-Composites for Nuclear Energy Systems,” C.H. Henager Jr., Y. Shin, L.A. Giannuzzi, B.W. Kempshall and S.M. Schwarz, Journal of Nuclear Materials, Volumes 367-370, Part 2, 1 August (2007), Pages 1139-1143.
“Electron Microscopy Sample Preparation For the Biological and Physical Sciences Using Focused Ion Beams,” L.A. Giannuzzi, B.I. Prenitzer, J.L. Drown-MacDonald, T.L. Shofner, S.R. Brown, R.B. Irwin, F.A. Stevie, Journal of Process Analytical Chemistry, vol. IV, No. 3,4, (1999) p. 162-167. Figure 2 from this article was chosen as the cover art for this issue of the journal.
“Characterization of FIB Damage in Silicon,” C.A. Urbanik, B.I. Prenitzer, L.A. Giannuzzi, S.R. Brown, T.L. Shofner, B. Rossie, R.B. Irwin, and F.A. Stevie, Microscopy and Microanalysis,” vol.5, supplement 2, Proceedings: Microscopy & Microanalysis 99, (1999), 740-741.
“Microstructural Evaluation of SIMS Crater Roughening,” B.I. Prenitzer, L.A. Giannuzzi, B.W. Kempshall, J.M. McKinley, and F.A. Stevie, in Secondary Ion Mass Spectrometry SIMS XII, eds. A. Benninghoven, P. Bertand, H.-N. Migeon and H.W. Werner, 2000, Elsevier, Proceedings of the 12th Annual Conference on Secondary Ion Mass Spectrometry , Brussels, Belgium, 5-11 September 1999, pp. 77-80.
Refereed Conference Proceedings
“Ni Diffusion in (100) Cu Twist Boundaries,” S.M. Schwarz, B.W. Kempshall, and L.A. Giannuzzi, Mass and Charge Transport in Inorganic Materials - II, Proceedings of the 2nd International Conference "Mass and Charge Transport in Inorganic Materials - Fundamentals to Devices" of the Forum on New Materials, part of CIMTEC 2002-10th International Ceramics Congress and 3rd Forum on New Materials, held in Florence, July 14-18, 2002, Vol.37 Advances in Science and Technology (2003) pp 231-238
“Ni Diffusion in Bi Segregated (100) Cu Twist Grain Boundaries,” B.W. Kempshall, S.M. Schwarz, and L.A. Giannuzzi, Mass and Charge Transport in Inorganic Materials - II, Proceedings of the 2nd International Conference "Mass and Charge Transport in Inorganic Materials - Fundamentals to Devices" of the Forum on New Materials, part of CIMTEC 2002-10th International Ceramics Congress and 3rd Forum on New Materials, held in Florence, July 14-18, 2002, Vol.37 Advances in Science and Technology (2003) pp239-248
“In-Situ Lift-Out FIB Specimen Preparation for TEM of Magnetic Materials,” B.W. Kempshall and L.A. Giannuzzi, Microscopy and Microanalysis, 8 (Suppl. 2), (2002), 390-391.
“Automated Crystallography and Grain Mapping in the TEM,” F. Bo Clayton, Brian W. Kempshall, Stephen M. Schwarz, and Lucille A. Giannuzzi, Microscopy and Microanalysis, 8 (Suppl. 2), (2002), 656-657CD.
“FIB Damage in Silicon: Amorphization or Redeposition?,” S. Rajsiri, B. W. Kempshall, S.M. Schwarz, and L. A. Giannuzzi, Microscopy and Microanalysis, 8 (Suppl. 2), (2002), 50-51.
“Practical Aspects Of FIB Milling: Understanding Ion Beam/Material Interactions,” B. I. Prenitzer, B. W. Kempshall, S. M. Schwarz, L. A. Giannuzzi, and F. A. Stevie, Microscopy & Microanalysis, 6 (Suppl 2: Proceedings), Microscopy Society of America, pp. 502-503 (2000).
“Effects of incident angle and target rotation on SIMS crater roughening,” L A Giannuzzi, B I Prenitzer, J M McKinley, and F A Stevie, Proceedings of the Second Conference of the International Union Microbeam Analysis Societies, Institute of Physics Conference Series Number 165, Institute of Physics Publishing, Bristol and Philadelphia, 2000, pp 353-354.
“STEM analysis of FIB damage in Silicon,” C Urbanik Shannon , B I Prenitzer, L A Giannuzzi , S R Brown, T L Shofner, B Rossi, C A Vartuli, R B Irwin, F A Stevie, Proceedings of the Second Conference of the International Union Microbeam Analysis Societies, Institute of Physics Conference Series Number 165, Institute of Physics Publishing, Bristol and Philadelphia, 2000, pp 177-178.
“Diffusion of Ion Implanted Elements in Silicon by TEM and SIMS,” R.R. Vanfleet, H. Francois-Saint-Cyr, F. Stevie, L. Giannuzzi, R. Irwin, B. Kempshall, T. Shofner, Microscopy & Microanalysis, 6 (Suppl 2: Proceedings), Microscopy Society of America, pp. 1082-1083 (2000).
“A Multidisciplinary Approach to the Understanding of Ion Induced Sputter Roughening,” L.A. Giannuzzi, B.W Kempshall, B.I. Prenitzer, J.M. McKinley, F. A. Stevie, 13th Annual SIMS Workshop 2000, April 30 – May 3, 2000, Lake Tahoe, NV, pp. 19-21.
“In-Situ Transformation of a Zinc TEM Lift-Out Specimen,” Microscopy and Microanalysis,” B.I. Prenitzer, S. Collins, and L.A. Giannuzzi, vol.5, supplement 2, Proceedings: Microscopy & Microanalysis 99, (1999), 928-929.
“TEM FIB Lift-Out Of Mount Saint Helens Volcanic Ash,” J. L. Drown-MacDonald, B. I. Prenitzer, T. L. Shofner+, and L. A. Giannuzzi, Microscopy and Microanalysis,” vol.5, supplement 2, Proceedings: Microscopy & Microanalysis 99, (1999), 908-909.
“Characterization of FIB Damage in Silicon,” C.A. Urbanik, B.I. Prenitzer, L.A. Giannuzzi, S.R. Brown, T.L. Shofner, B. Rossie, R.B. Irwin, and F.A. Stevie, Microscopy and Microanalysis,” vol.5, supplement 2, Proceedings: Microscopy & Microanalysis 99, (1999), 740-741.
“Advances in the FIB Lift-Out Technique for TEM Specimen Preparation: HREM Lattice Imaging,” L.A. Giannuzzi, B.I. Prenitzer, J.L. Drown-MacDonald, S.R. Brown, R.B. Irwin, and F.A. Stevie, T.L. Shofner, Microstructural Science, Volume 26, The 31st Annual Technical Meeting of the International Metallographical Society, (1999), 249-253.
“Microstructural Evaluation of SIMS Crater Roughening,” B.I. Prenitzer, L.A. Giannuzzi, B.W. Kempshall, J.M. McKinley, and F.A. Stevie, in Secondary Ion Mass Spectrometry SIMS XII, eds. A. Benninghoven, P. Bertand, H.-N. Migeon and H.W. Werner, 2000, Elsevier, Proceedings of the 12th Annual Conference on Secondary Ion Mass Spectrometry , Brussels, Belgium, 5-11 September 1999, pp. 77-80.
“The Effect of Milling Parameters on Aspect Ratios Attainable in FIB Milled Features,” B.I. Prenitzer, L.A. Giannuzzi, S.R. Brown, R.B. Irwin, T.L. Shofner, and F.A. Stevie, 12th Annual SIMS Workshop, April 1999, p 70-72.
“The Influence of Incident Ion Range on the Efficiency of TEM and SEM Specimen Preparation of Focused Ion Beam Milling,” B.I. Prenitzer, L.A. Giannuzzi, S.R. Brown, R.B. Irwin, T.L. Shofner, F.A. Stevie, Electron Microscopy 1998, ICEM14, Symposium K, Volume III, eds., H.A. Calderon Benavides and M. Jose Yacaman, Institute of Physics, Bristol, (1998) 711-712.
Referred Extended Abstracts
“FIB Specimen Preparation for STEM and EFTEM Tomography,” S.M. Schwarz and L.A. Giannuzzi, Microscopy and Microanalysis, 10 (Suppl 2), (2004)
“Multiple Analytical Instrumentation for Complete Materials Characterization,” Stephen M. Schwarz, Brian W. Kempshall, Lucille A. Giannuzzi, and Fred A. Stevie, in press, Microscopy and Microanalysis, 9 (Suppl 2), (2003), 256-257.
“Issues Affecting Quantitative Evaluation of Dopant Profiles Using Electron Holography,” M.R. McCartney, Jing Li, Partha Chakraborty, L.A. Giannuzzi, S.M. Schwarz, Microscopy and Microanalysis, 9 (Suppl 2), (2003), 776-777.
“Avoiding the Curtaining Effect: Backside Milling by FIB INLO,” Stephen M. Schwarz, Brian W. Kempshall, Lucille A. Giannuzzi, and Molly R. McCartney, in press, Microscopy and Microanalysis, 9 (Suppl 2), (2003), 116-117.
“Phase Transformation of Thermally Grown Oxide on (Ni,Pt)Al Bond Coat During Electron Beam Physical Vapor Deposition and Subsequent Oxidation,” S. Laxman, B. Franke, B.W. Kempshall, Y.H. Sohn, L.A. Giannuzzi, K.S. Murphy, in press, Proceedings of the 2003 International Conference on Metallurgical Coatings and Thin Films – ICMCTF, April 26-May2, 2003, San Diego, CA, USA.
“Automated Crystallography and Grain Mapping in the TEM,” F. Bo Clayton, Brian W. Kempshall, Stephen M. Schwarz, and Lucille A. Giannuzzi, Microscopy and Microanalysis, 8 (Suppl. 2), (2002), 656-657CD.
“Assessment of Failure Mechanisms for Thermal Barrier Coatings by Photoluminescence, Electrochemical Impedance and Focused Ion Beam”, Y.H. Sohn , B.W. Kempshall, V.H. Desai and L.A. Giannuzzi,Proceedings of the 2003 High Efficiency Engines and Turbines (HEET) Materials Workshop III, pp. 52-74, (November, 2002).
“In-Situ FIB Lift-Out For Site Specific Tem Specimen Preparation Of Grain Boundaries And Interfaces,” B.W. Kempshall, S.M. Schwarz, and L.A. Giannuzzi, Proceedings of the International Congress on Electron Microscopy (ICEM 15), Vol. 1, Durban, South Africa, September 2002, 249-250.
“Use of SIMS to Determine Grain Boundary Diffusion,” S.M. Schwarz, B.W. Kempshall, L.A. Giannuzzi, and F.A. Stevie, 15th Annual Workshop on SIMS, Clearwater, FL, April 29 – May 2, 2002, International.
“TEM of Sub-Micrometer Particles Using the FIB Lift-Out Technique,” Lanice K. Lomness, Brian W. Kempshall, Lucille A. Giannuzzi, Mark B. Watson, Microsc. Microanal., 7 (Suppl 2: Proceedings), Microscopy Society of America, (2001), 950-951.
“Practical Aspects Of FIB Milling: Understanding Ion Beam/Material Interactions,” B. I. Prenitzer, B. W. Kempshall, S. M. Schwarz, L. A. Giannuzzi, and F. A. Stevie, Microscopy & Microanalysis, 6 (Suppl 2: Proceedings), Microscopy Society of America, pp. 502-503 (2000).
“Material Dependence of Sputtering Behavior During Focused Ion Beam Milling: A Correlation between Monte Carlo Based Simulation and Empirical Results,” B.I. Prenitzer, L. A. Giannuzzi, S. R. Brown, R. B. Irwin, T. L. Shofner, and F. A. Stevie, Microscopy and Microanalysis 1998 Proceedings, Microscopy Society of America, Springer p. 858-859 (1998).
Books
“The Focused Ion Beam Instrument,” F.A Stevie, L.A. Giannuzzi, and B.I. Prenitzer, in Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques, and Practice, eds. Lucille A. Giannuzzi, and Fred A. Stevie, Springer, (2005) 1-12.
“FIB Lift-Out Specimen Preparation Techniques: Ex-situ and In-Situ Methods,” L.A. Giannuzzi, B.W. Kempshall, S.M. Schwarz, J.K. Lomness, B.I. Prenitzer, and F.A. Stevie, in Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques, and Practice, eds. Lucille A. Giannuzzi, and Fred A. Stevie, Springer, (2005), 201-228.