Instrumentation and Techniques

Areas of Expertise

NanoSpective provides materials science solutions for companies who need to know more about the materials of which their products are madeā€”even down to the atomic level.

NanoSpective offers a suite of advanced materials characterization options. We use cutting edge technology and state of the art equipment to perform nanoscale and macroscopic material property evaluation. Our scientists have industry and research experience in a broad spectrum of materials systems. At NanoSpective, our experience and technical expertise coupled with our equipment deliver unique capabilities in the areas of integrated circuit, solid-state photonics, liner and thin film analyses.

NanoSpective is expert in optical, X-ray, ion and electron beam characterization techniques. The Zeiss ULTRA FEG-55 SEM coupled with Noran System 7 SDD EDS system allows high lateral resolution and high depth of field morphological and elemental analyses of a range of specimens including magnetic materials. Using the FEI 200TEM and FEI DB235, any site-specific region of interest can be pinpointed with sub-micrometer accuracy. The FIBs are equipped so that both in- situ and ex-situ specimen preparation techniques are available. With the Physical Electronics Adept 1010, Cameca IMS-3f SIMS, Cameca IMS-6f SIMS and the ION TOF SIMS5 the composition of a material may be determined in the part per billion to part per trillion range. The fully loaded state of the art FEI TF30 field emission TEM allows the determination of the crystallography, microstructure, composition and chemistry of a material from regions only nanometers in size. The TF30 is equipped with energy dispersive X-ray analysis (X-EDS), electron energy loss spectroscopy(EELS) and a Gatan Imaging Filter system (GIF) used for energy filtered TEM(EFTEM). Detailed analyses may also be performed by using the high resolution imaging techniques in bright field (BF), dark field (DF) and scanning transmission modes (STEM).

Contact us at (407) 249-1440.

Advanced Materials Characterization Techniques

Focused Ion Beam (FIB)

Field Emission Transmission Electron Microscopy (FE TEM)
Scanning Transmission Electron Microscopy (STEM)
Electron Energy Loss Spectroscopy (EELS)
Energy Filtered TEM (EFTEM)
Energy Dispersive X-Ray Spectroscopy (X-EDS)
Field Emission Scanning Electron Microscopy (FE SEM)
Secondary Ion Mass Spectrometry (SIMS)
Light Optical Microscopy (LOM)
Backscattering Spectrometry (RBS)
X-Ray Photoelectron Spectroscopy (XPS)
Auger Electron Spectroscopy (AES)
X-Ray Diffraction (XRD)
Optical Testing
Surface Metrology
Raman Spectroscopy
Fourier Transform Infrared Spectroscopy (FTIR)